Automotive applications
Manufacturing companies today face significant changes due to fierce global competition. It has never been more important to innovate. ESI Group’s solution PAM-CRASH 2G is specifically designed to improve passenger comfort and safety and to shorten our customers’ design cycle.
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OEMs
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PAM-CRASH 2G investigates the cast subframe prediction on the chassis of the new VW Passat.
“PAM-CRASH 2G is a solution to drive business value and gain a competitive edge. We used PAM-CRASH 2G for the frontcrash simulation with subframe failure prediction. Its multi-scale coupling using subcycling enables the representation of locally refined models for detailed failure analysis. Computation time has been greatly decreased due to subcycling in comparison with standard PAM-CRASH 2G jobs. Morevover, code coupling enables further applications, like convenient handling for Car-To-Car crash.” |
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Mr. Greve, CAE Methods, Volkswagen Group Research |
| “Hyundai uses PAM-CRASH 2G to speed product development and drive collaboration. In the certification process of a vehicle, PAM-CRASH 2G enabled us to take up the challenge of decreasing the number of prototype phases. Modeling of crash impact and airbags position have been carried out in a reasonable computation time, saving time and reducing delays, allowing us testing on more crash scenarios. ” |
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S.G. Hong, Vehicle CAE Team Leader, Hyundai |
| “The body structure of Skoda Fabia, was entirely designed with the help of PAM-CRASH 2G. Increased competition and higher market standards, have made it impossible for Skoda Auto to develop a car model without resorting to computational simulation. ESI Group’s simulation solution for crash analysis within the VW Group, has taken our company one step closer towards fully virtual prototypes.” |
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Ing. Miloš Šáfr, Manager of FEM department, Škoda Auto, a.s. |
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Suppliers
Developing body-in-white without prototypes requires accurate material models. To predict the crash behavior of stamped components, ESI Group offers solutions that couple the various modules of PAM-STAMP 2G with PAM-CRASH 2G. PAM-STAMP 2G results can be mapped on crash models for increased accuracy and to provide a first level of material rupture prediction.
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Mr. Norbert Schulte-Frankenfeld, Manager of CAE, Wilhelm Karmann GmbH |
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| "A coupled PAM-CRASH/PAM-STAMP approach helps to design parts to their just needed performances" | ||||||
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Laurent Taupin, ACI |











